Quick Summary
1. Scan insertion, scan compression and chain stitching at block level, with scan DRC debug and fixing.
Requirements
~1 min read1. Scan insertion, scan compression and chain stitching at block level, with scan DRC debug and fixing. ATPG for stuck-at and transition (at-speed) fault models; meets coverage targets and analyses low-coverage causes (untestable, ATPG-untestable and aborted faults).
2. Pattern simulation with zero-delay and SDF-annotated (timing) gate-level simulation using VCS or Xcelium; debugs simulation failures.
3. MBIST insertion and verification for block memories; basic understanding of memory repair.
4. JTAG (IEEE 1149.1) and boundary scan; exposure to IJTAG (IEEE 1687) networks.
5. Writes DFT constraints for synthesis and STA in shift and capture modes, and supports DFT-mode timing closure.
6. Pattern retargeting from core to top level in a hierarchical DFT flow.
7. Generates patterns and delivers them to the ATE team; supports debug of failing patterns on silicon.
8. Hands-on with Tessent, TestMAX / DFT Compiler, or Modus.
9. Scripting in Tcl, Python or Perl. LBIST exposure is a plus.
scan insertion, ATPG, Gate-level simulation
scan compression, chain stitching, scan DRC debug
Location & Eligibility
About this job
- Posted
- Today
Listing Details
- Posted
- October 21, 2026
- First seen
- October 21, 2026
- Last seen
- October 21, 2026
Posting Health
- Days active
- 0
- Repost count
- 0
- Trust Level
- 58%
- Scored at
- October 21, 2026
Signal breakdown
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