Quick Summary
1. Hierarchical DFT: core wrapping (IEEE 1500), pattern retargeting and top-level DFT integration. 2. Chooses scan compression configuration and chain balancing based on test time and pin budget. 3.
Requirements
~1 min read1. Hierarchical DFT: core wrapping (IEEE 1500), pattern retargeting and top-level DFT integration.
2. Chooses scan compression configuration and chain balancing based on test time and pin budget.
3. Drives coverage closure through test-point insertion, ATPG constraint tuning and low-coverage debug.
4. MBIST with repair (BISR, eFuse) integration, and understanding of memory test algorithms.
5. Builds IJTAG (IEEE 1687) networks, TAP controller and boundary scan (IEEE 1149.1 / 1149.6).
6. Owns DFT-mode timing: shift, capture and at-speed constraints, OCC clock controllers, and closure with STA and PD teams.
7. Owns DFT gate-level simulation sign-off for all test modes.
8. Delivers ATE-ready patterns (STIL / WGL) and supports first-silicon bring-up on the tester.
9. Plans, estimates and tracks DFT tasks; mentors 2–3 engineers and reviews their work.
10. Builds automation for DFT flows and reports in Tcl or Python.
Hierarchical DFT, core wrapping, IEEE 1500
IJTAG networks, ATE bring-up, test-point insertion
Location & Eligibility
About this job
- Posted
- Today
Listing Details
- Posted
- October 21, 2026
- First seen
- October 21, 2026
- Last seen
- October 21, 2026
Posting Health
- Days active
- 0
- Repost count
- 0
- Trust Level
- 58%
- Scored at
- October 21, 2026
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